Microscopy eletrọn na-enyocha ngwa ngwa

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Ultrafast scanning electron microscopy (UFSEM) jikọtara usoro microscopic abụọ, Pump-probe microscopy na Scanning electron mikroskopy, iji chịkọta ihe omume nke ógè na nkè oghere. Usoro a na-eji pulses laser ultrashort màkà mkpali nke ihe ahụ na nzaghachi nnwale ga-achọpụta site na Ihe nchọpụta Everhart-Thornley. Inweta data na-adabere n'ụzọ bụ isi na mmepụta nke ihe oyiyi site na ọnọdụ Nnyocha raster mgbè ịpịpụ na obere laser pulse n'oge dị iche iche. A ga-eme njirimara nke onyinyo mmepụta site na akụkụ mkpebi oge.   [1][nkọwa dị mkpa] Ya mèrè, echiche ahụ bụ iji DeBroglie wavelength dị mkpirikpi mee ihe banyere photons nke nwéré mmetụta dị ukwuu iji mụbaa mkpebi ahụ ihe dị ka otu nm.  Usoro ahụ bụ ụzọ ọgbara ọhụrụ iji mụọ ihe na-akpali akpali nke ụgwọ n'elu ihe.

Oge a na-edozi na scanning electron spectroscopy[dezie | dezie ebe o si]

[2]Ernst Ruska bụ ónyé ọkà mmụta Germany nke izizi meriri Ihe nrite Nobel n'afọ 1986 màkà ọrụ ya na mmepe nke microscope electron n'afọ 1933 na mmekorita ya na Max Knoll. N'oge ndị a, electron microscopy bụ ngwá ọrụ a na-eji eme ihe n'ihi nkwalite ọ bụghị naanị mkpebi ohere banyere microscope ányá kamakwa ọdịiche dị elu na mmetụta dị ịrịba ama n'ihi eziokwu ahụ bụ na ike nke electrons na-emetụta ihe ahụ ma e jiri ya tụnyere photons.   [nkọwa dị mkpa]} Site n'echiche ahụ, a gbanwere teknụzụ nke microscopy electron ultrashort site na enyemaka nke Ultrashort pulse laser nke na-enye ndị ọkà mmụta sayensị ohere ịchọpụta ihe na-agbanwe agbanwe n'oge dị mkpirikpi na nke dị mkpirisi. [3] nwèrè mgbalị mbụ iji wee bido usoro a site n'aka Larry D.Flesner na patent US n'afọ 1990, o tinyere microscopy electron scanning na ìhè modulated iji mụọ semiconductor surface photovoltaic na oge na ohere. [4][5][6][7][8]'oge ndị a, emeela ka microscopy pump-probe dị mma mgbè Ahmed Zewail chọpụtara ógè femtosecond maka mmeghachi omume kemịkal ma nye ya onyinye Nobel màkà nchọpụta akụkọ ihe mere eme ya.

Nnyocha electron microscopy[dezie | dezie ebe o si]

Ihe osise na-egosi ihe ndị na-eme site na mmekọrịta nke electrons dị ike na ihe, na-egosipụtakwa ọnụ ọgụgụ mmekọrịta mmekọrịta nke a na-ahụkarị na ụdị mmekọrịta a.

Scanning electron microscopy [9] usoro dị ike iji nye map zuru oke nke elu ihe nlele na ihe onwunwe dị n'ime ígwè dịgasị iche iche, semiconductor ọbụna ihe nlele ma na-arụ ọrụ mgbè niile na gburugburu ébé obibi. Echiche ọrụ bụ isi na-adabere na mmepụta nke ụzarị isi site na cathode nke na-agafe na kọlụm electron. Ogidi ahụ nwèrè usoro eletromagneti eletrik nke na-elekwasị ányá n'ike nke ụzarị ahụ ma site na usoro a, ụzarị isi na-eru ihe atụ ahụ na nanometers ole na ole. Na ụkpụrụ, ọ bụrụ na ọkpụrụkpụ nke ihe nlele dị n'ime micrometers ole na ole, a ga-ebelata ụzarị isi ahụ kpamkpam site na ịgbasa ya na electrons ma ọ bụ lattices ndị ọzọ. N'ezie, usoro mmekọrịta ọkụ bụ isi nwèrè ike ịbụ ihe na-agbatị agbatị ma ọ bụ ihe na-adịghị agbatị agbagọ. [10] ikpe mbụ, ọ dịghị ọnwụ nke ike na-eme, a maara nke a dị ka electron na-agbasa azụ. N'aka nke ọzọ, n'ihe gbasara usoro mmekọrịta na-adịghị agbatị agbatị, electron sitere na sample site na eV ruo KeV irí ato. Mmetụta ahụ nwèrè ike ịbụ nnukwu oghere ma ọ bụ mmepụta oghere electron. Ihe osise ahụ gosipụtara na-achịkọta ụdị mmekọrịta niile nwèrè ike ịdị na omimi ha metụtara ihe nlele ahụ. Dịka ọmụmaatụ, X-ray sitere na omimi dị ogologo ma ọ bụ Electron Auger mepụtara n'elu. Ya mèrè, dabere na ike sitere na sample ahụ, a ga-eji ihe nchọpụta ụfọdụ mee ihe dịka ike a na-ewepụta. Ihe oyiyi ikpeazụ, ntụ a nwetara ma wughachi site na ọnọdụ Nnyocha raster, a na-enweta ya na grayscale. N'ihi eziokwu ahụ bụ na mmepụta nke electrons nke abụọ erughị iri ise eV nke a chịkọtara n'ezie n'ihi mgbagwoju anya na-adịghị agbatị agbatị site na oke mmekọrịta ya na ihe atụ ahụ mana ọ bụ naanị ndị dị nso n'elu ka a ga-achọpụta. Ya mèrè, mmepụta nke abụọ nke electron na-ewere na ọ na-emetụta elu n'ihi na ọgbọ ya na-eme site na naanị nanometers nke omimi. Ihe nlele n'onwe ya na-arụ ọrụ dị mkpa na mpụga dabere na ọrụ ọrụ mpaghara nke ihe nlele ahụ. Ihe ndị a ahọpụtara SEM ka ọ bụrụ ụlọ ọrụ dị ọnụ ala karịa na micro na nano scale regimes.

Pump probe microscopy[dezie | dezie ebe o si]

Usoro mgbapụta na physics.

Ihe omume Pump-probe microscopy, nkè a maara nkè ọma dị ka transient absorption microscopy. [11] Ọ bụ ụdị ụzọ na-abụghị nké na-ebido site na mkpali nke ihe ahụ site na ntakiri pulse laser beam (pump), nke na-akpata mgbanwe n'ime. Ígwé nyocha na-esochi igwe mgbapụta iji chọpụta ọganihu e méré n'ime ihe ahụ n'oge dị mkpirikpi. N'eziokwu, enwere ike ịgbanwe nzaghachi ahụ site n'ịchịkwa ógè igbu ógè n'etiti mgbapụta na nyocha ma site na nke a, a ga-eji echiche nke Time-resolved spectroscopy mee ihe iji chọpụta usoro mgbanwe dị ka ọrụ ógè. [12] N'ogè ndị a, mmetụta a na-enwe ekele iji nweta ọganihu dị elu na ihe omume ahụ na-abịa kpọmkwem site na anya na-abụghị nke ahịrị. [13] E nwèrè ọtụtụ ụzọ màkà mmekọrịta na-abụghị usoro, dịka ọmụmaatụ ọgbọ nke abụọ, Coherent anti-Stokes Raman ma ọ bụ fluorescence abụọ na-akpali akpali. Ihe [14]-adọrọ mmasị na microscopy electron scanning Ultrafast bụ ike ọ na-enweta site na ijikọta mkpebi dị elu nke electrons na mkpebi oge nke microscopy pump-probe ultra-fast.

Edensibia[dezie | dezie ebe o si]

  1. ↑ Zhu (October 2009). "Imaging single atoms using secondary electrons with an aberration-corrected electron microscope" (in en). Nature Materials 8 (10): 808–812. DOI:10.1038/nmat2532. ISSN 1476-4660. PMID 19767737. 
  2. ↑ Knoll (May 1932). "Das Elektronenmikroskop". Zeitschrift für Physik 78 (5–6): 318–339. DOI:10.1007/BF01342199. 
  3. ↑ US Patent for Scanning electron microscopy by photovoltage contrast imaging Patent (Patent # 4,902,967 issued February 20, 1990) - Justia Patents Search. patents.justia.com.
  4. ↑ Park (1 September 2007). "Atomic-Scale Imaging in Real and Energy Space Developed in Ultrafast Electron Microscopy". Nano Letters 7 (9): 2545–2551. DOI:10.1021/nl071369q. ISSN 1530-6984. PMID 17622176. 
  5. ↑ Vanacore (12 November 2014). "Diffraction of Quantum Dots Reveals Nanoscale Ultrafast Energy Localization". Nano Letters 14 (11): 6148–6154. DOI:10.1021/nl502293a. ISSN 1530-6984. PMID 25099123. 
  6. ↑ Barwick (21 October 2015). "Photonics and Plasmonics in 4D Ultrafast Electron Microscopy". ACS Photonics 2 (10): 1391–1402. DOI:10.1021/acsphotonics.5b00427. 
  7. ↑ Vanacore (April 2016). "Four-dimensional electron microscopy: Ultrafast imaging, diffraction and spectroscopy in materials science and biology". Nano Today 11 (2): 228–249. DOI:10.1016/j.nantod.2016.04.009. 
  8. ↑ Zewail (8 April 2010). "Four-Dimensional Electron Microscopy". Science 328 (5975): 187–193. DOI:10.1126/science.1166135. PMID 20378810. 
  9. ↑ McMullan (1995). "Scanning electron microscopy 1928–1965" (in en). Scanning 17 (3): 175–185. DOI:10.1002/sca.4950170309. 
  10. ↑ Seiler (November 1983). "Secondary electron emission in the scanning electron microscope". Journal of Applied Physics 54 (11): R1–R18. DOI:10.1063/1.332840. 
  11. ↑ Fischer (March 2016). "Invited Review Article: Pump-probe microscopy". Review of Scientific Instruments 87 (3): 031101. DOI:10.1063/1.4943211. PMID 27036751. 
  12. ↑ Davydova (January 2016). "Ultrafast transient absorption microscopy: Study of excited state dynamics in PtOEP crystals". Chemical Physics 464: 69–77. DOI:10.1016/j.chemphys.2015.11.006. 
  13. ↑ Shen (February 1989). "Surface properties probed by second-harmonic and sum-frequency generation". Nature 337 (6207): 519–525. DOI:10.1038/337519a0. 
  14. ↑ Yang (9 August 2010). "Scanning ultra-fast electron microscopy". Proceedings of the National Academy of Sciences 107 (34): 14993–14998. DOI:10.1073/pnas.1009321107. PMID 20696933. 

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